Element & phase analysis, particle sizes and molecular structure
For all tasks in polymer research, development and production quality control, X-ray Fluorescence (XRF) analysis can identify and quantify the concentrations of additives (pigments, fillers, flame retardants, stabilizers) such as antimony, barium, bromine, calcium, chromium (in accordance with RoHS/WEEE regulations), copper, phosphorus, titanium or zinc. In addition, many plastic polymers have some degree of order that can be identified and studied by X-ray Diffraction (XRD) methods. The percent crystallinity—measured with XRD—can correlate to processing methods. The determination of unit cell type, lattice parameters, microstructure and crystallographic orientation through pole figures can be of importance. Periodic or crystalline structures on the nanoscale can be examined by Small Angle X-ray Scattering (SAXS) and Wide Angle X-ray Scattering (WAXS). Rigaku offers comprehensive Instruments and services for all methods.
EGA, Thermal Analysis
X-ray CT, Computed tomography
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).