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  • Available in-plane arm (5-axis goniometer)
  • High-flux X-ray source: PhotonMax
  • HyPix-3000 high energy resolution 2D HPAD detector
  • New CBO family, with fully automated beam switchable CBO-Auto
  • New CBO family, with high-resolution micro area CBO-μ
  • Operando measurements with SmartLab Studio II software
  • Multi-year component warranty contributes to low cost of ownership
Audit Trail

Automated multipurpose X-ray diffractometer (XRD) with Guidance software

Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements

Rigaku SmartLab® is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

XRD engineered for performance

This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measure­ment modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).

XRD designed for usability

Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

XRD that is functionality redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component - software or hardware - fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).

Product name SmartLab
Technique X-ray diffraction (XRD)
Benefit Powder diffraction, thin film, SAXS, in-plane scattering, operando measurements
Technology Automated high-resolution θ-θ multipurpose X-ray diffractometer (XRD) with expert system Guidance software
Core attributes 3 kW sealed X-ray tube, CBO optics, D/teX Ultra 250 silicon strip detector
Core options PhotonMax high-flux 9 kW rotating anode X-ray source, in-plane arm (5-axis goniometer), HyPix-3000 high energy resolution 2D HPAD detector, Johansson Kα₁ optics
Computer External PC, MS Windows® OS, SmartLab Studio II software
Core dimensions 1300 (W) x 1880 (H) x 1300 (D) mm
Mass (core unit) Approx. 750 kg (sealed tube) , 850 kg (rotating anode)
Power requirements 3Ø, 200 V 50/60 Hz, 30 A (sealed tube) or 60 A (rotating anode)

Video for SmartLab diffractometer

Options and Accessories

The following accessories are available for this product
D/teX Ultra 250 HE

The D/teX Ultra 250 HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%.

D/teX Ultra 250

The D/teX Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.

Anton Paar TTK 600 Low Temperature Chamber

The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum, air or inert gases. An antechamber option allows safe transfer of air-sensitive samples into the TTK 600.

The TTK 600 fits to all common powder diffractometers and is the instrument of choice for X-ray structure analysis of various sample types at low and medium temperatures.

  • Non-ambient attachment for X-ray diffraction studies from -190 °C to 600 °C
  • For investigations on samples in reflection and transmission geometry
  • Also for air-sensitive samples and in-operando studies on batteries
  • Fits to all common powder diffractometers
Simultaneous XRD and DSC

Simultaneous collection of XRD and DSC data eliminates the uncertainty of separate measurements. With the addition of a humidity generator, the XRD-DSC system provides the ability to study crystalline-amorphous and amorphous-amorphous changes at constant temperature and variable humidity or variable humidity at constant temperature.

  • Enables simultaneous characterization of dehydration, polymorphic phase transitions, melting, crystallization, and decomposition of geological samples
  • Distinguishes exothermic and endothermic reactions and provides their enthalpies and temperatures
  • Probes the effects of temperature history and heat treatment on structural and thermal properties
  • Requires only milligrams of sample
  • Humidity attachment for hydration studies
HyPix-3000 Hybrid Pixel Array Detector

2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector.

Anton Paar HTK 2000N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder XRD of refractory materials. The use of a tungsten strip offers extremely high temperature and fast heating and cooling, the strip pre-stressing mechanism ensures high sample position stability.

Temperature range:

with W-strip: 25 °C to 2300 °C in vacuum
with Pt -strip: 25 °C to 1600 °C in air, vacuum

Atmospheres: vacuum(10⁻⁴ mbar), inert gas, air

Anton Paar HTK 16N High-Temperature Chamber

High-temperature sample heating stage with strip heater for powder diffraction. Allows for very fast heating and cooling and ensures high sample position stability with heating strip pre-stressing.

Temperature range:

with Pt-strip: 25 °C to 1600 °C in air, vacuum
with Ta and C-strip: 25 °C to 1500 °C in vacuum

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar DHS 1100 Domed Hot Stage

Sample heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with air-cooling.

Temperature range: 25 °C to 1100°C

Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Anton Paar HTK 1200N High-Temperature Oven Chamber

High-temperature heating stage for powders and polycrystalline solid samples. Heating to 1200 °C in air and vacuum possible.

Main features:

  • furnace heater for good temperature uniformity
  • sample spinning for good data quality
  • capillary option for transmission XRD
  • easy sample loading

Temperature range: 25 °C to 1200 °C

Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar)

Anton Paar DCS 350 Domed Cooling Stage

Sample cooling and heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with liquid nitrogen sample cooling.

Temperature range: -100 °C to 350 °C

Atmospheres: air, inert gas, vacuum(10⁻¹ mbar)

Secondary Monochromator

The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα.

RxRy Tilt Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

Mapping Stage

Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available.

Learn more about our products at these events

Booth number Date Location Event website
MRS Spring 2024 - Seattle, WA Website
Ceramics Expo 2024 - Novi, MI Website
The Advanced Materials Show - Birmingham, United Kingdom Website
JCAT54 - Clermont-ferrand, France Website
European Conference on Residual Stresses - ECRS11 - Prague, Czech Republic Website
UKPorMat - Liverpool, United Kingdom Website
LABOREXPO 2024 - Prague, Czech Republic Website
Konwersatorium Krystalograficzne - Wrocław, Poland Website
AFC 2024 (French Cristallography Meeting) - Montpelier, France Website
DXC 2024 - Westminster, CO Website
ECM2024 - Padova, Italy Website
Epdic 18 - Padova, Italy Website
GSA 2024 - Anaheim, CA Website
MS&T24 2024 - Pittsburgh, PA Website
MRS Fall 2024 - Boston, MA Website

Upcoming training sessions

Title Dates Cost Location Notes Course outline Registration form
SmartLab training (Europe) - Please contact Neu-Isenburg, Germany Class outline Registration form
SmartLab training (Europe) - Please contact Neu-Isenburg, Germany Class outline Registration form

SmartLab Testimonials

Milan Dopita at Department of Condensed Matter Physics, Charles University

In our institute we purchased the Rigaku SmartLab diffractometer in January 2018 after extended and rigorous search within similar devices offered worldwide.

Our SmartLab diffractometer contains the configuration with:

  • 9 kW rotating anode x‐ray source,
  • in‐plane detector arm,
  • parallel beam geometry introduced by incident beam parabolic x‐ray mirror or Bragg‐Brentano parafocusing geometries,
  • high resolution settings with Ge(220)x2 channel‐cut monochromator in incident beam and Ge(220)x2 channel‐cut analyzer in diffracted beam,
  • all instrumental settings is possible with Kα1

Ondřej Caha at Masarykova univerzita

We purchased Rigaku Smartlab 3 diffractometer in 2012, with installation in January 2013. The diffractometer was selected after a long selection process considering available instruments on the marked. The installed diffractometer is equipped with:

  • 9kW rotating anode Cu x-ray source,
  • in-plane detector arm,
  • cross-beam optics allowing for parallel beam as well as Bragg-Brentano setup
  • Ge (220)x2 and Ge (220)x4 monochromators, and Ge (220)x2 analyzer
  • high-temperature chamber Anton Paar OHS 1100

Later we have purchased a two-dimensional detector HyPix 3000, since it was not available at

Joseph Wright at University of East Anglia

What was the main problem, or challenge, that you were trying to solve by buying a new diffractometer?
Our old system was at the end of its life, and was not capable of the full range of experiments we are interested in today
How has the new instrument from Rigaku changed the workflow in your lab ?
The new system is much faster than the old machine, and at the same time offers greatly improved resolution. So we can do better experiments faster.
Can you describe the single most important benefit the (SmartLab) instrument brings to your research?
Rapid screening of samples at a resolution